Defect and Microstructure Analysis by Diffraction

Autor: R. L. Snyder, Jaroslav Fiala, H.-J. Bunge, International Union of Crystallography, Robert Snyder

$R. L. Snyder, Jaroslav Fiala, H.-J. Bunge, International Union of Crystallography, Robert Snyder: Defect and Microstructure Analysis by Diffraction$

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Kategorie: Krystalografie
Naše cena: 381.01 EUR (cca 9344 Kč)
(cena aktualizována 04.04.2026)

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